Construction of Six-Sigma Based Control Charts Under Exponentiated Mukherjee - Islam Distribution for Statistical Process Control

Abstract

In the domain of process monitoring, statistical process control, or SPC, is frequently employed when the quality of interest is normally distributed. In actuality, the variable of interest may follow any non-normal distribution, such an exponential, gamma, or other distribution. It is not necessarily true that the variable of interest follows the normal distribution. It might not be feasible to employ control charts made for a normal distribution in this case, which could lead to an increase in the percentage of non-conforming goods. This research article employs Length Biased distribution strategies to evaluate the performance of the production process using the EMID through the six-sigma based control charts. This research paper's primary goal is to study and monitor the production system by introducing a six-sigma based control chart utilizing the New Generalization of EMID.